*** TEA5 - Products ***

Phone: 650-961-5900
FAX: 650-323-9237

E-Mail: bsiegal@thermengr.com

Thermal Test System Screen Shots
(The images shown here are from the TTS-4200 system but, in general, apply to all TTS units)

	This is the opening screen when the system powers up. The user must click on the Log On button and subsequently enter a correct name and password before gaining access to the system's various operations. The four screen icons shown in the center represent the four system operations - - Create or recall test setups on the SETUP screen (top left) - Perform tests with the RUN screen (top right) - Review previously collected data with the VIEW screen (bottom left) - Check system's operational performance using the CALIBRATE/VERIFY screen (bottom right) A mouse click on one of the four screens brings up that system operation.
	This dialog box appears when the Log On button in the opening screen above is clicked. There are three levels of system users - - Operator can load test setups, run test and collect data - Engineer can do the same but also can create test setups - Administrator can do all system functions and create users, passwords and user level Operators and Engineers enter their name and password, then click Log On button. Administrators do the same but when their name and password is entered, the Edit Passwords button becomes active.
	This is the screen for either creating or recalling test setup conditions (i.e., test programs) for Diode thermal testing. File and computer operations are on the far left, parametric test conditions are in the center left and data collection selection and limits are on the right. Pass/Fail limits on one or two data parameters are selected by dragging the data parameter icon into one of the two white boxes on the bottom right portion of the screen. Once the parameter icon is in place, the low and high limit slided bars become active and the desired limits can be entered.
	This is the screen for either creating or recalling test setup conditions (i.e., test programs) for IC thermal testing. File and computer operations are on the far left, parametric test conditions are in the center left and data collection selection and limits are on the right. Pass/Fail limits on one or two data parameters are selected by dragging the data parameter icon into one of the two white boxes on the bottom right portion of the screen. Once the parameter icon is in place, the low and high limit slided bars become active and the desired limits can be entered.
	Once the test setup has been completed by either recalling a previously created Test Setup file or creation of a new one, clicking on the RUN button brings up the RUN screen. The one shown is for Diodes and the data listing in in tabular form. The left screen portion contains icon buttons for system operation - start test, pause test, quit test/save data, and exit screen. The four vertical bars show the temperature being read by the system's thermocouples. To the right of these bars are the test conditions, parameter selection and general test information. Below this information are operator selectable options for data logging, voltage monitoring, and serial number mode (automatic or operator entry). The progress bar in the center right portion of the screen is useful for for long duration testing.
	The data can also be presented in graphical form by clicking on the CHART button on the top right of the screen. A diode Cooling Curve is shown here. Moving the cursor to a position on the curve and performing a right-click on the mouse will generate a best-fit regression line for automatically correcting the effects of junction cooling during the measurement. *Clicking on the TEA* logo in the top left will cause the system to print out the data on the system's color printer. This operation is available for all RUN and VIEW screens.**
	This RUN screen shows a Heating Curve for an IC. The vertical axis scales automatically so as to present the data in the most meaningful way. The horizontal axis is logarithmic, with the minimum value at 1ms and the maximum values set to the progrmmed Heating Time. Curves for any of the selected data parameters can be seen by clicking on the parameter symbol above the graph portion of the screen. The actual data behind the curve can be seen by clicking on the Table button in the top right of the screen.
	When testing in the Manual Mode (i.e., a single Heating Time value for a test sample lot of more than a few devices), the data can be presented in either tabular form (Table button) or in histogram form (Chart button). Histograms can be shown for each of the selected data parameters by clicking on the parameter symbol above the histogram. Axis scaling for both the vertical and horizontal is done automatically to maximize the data presentation.
	The VIEW screen is used to look at previously collected and stored data. The test data files is selected from either the list of files shown in the left-hand portion of the screen or accessed through the file folder icon button just above the list. Once a test data file has been selected and loaded, the test condition and device information is shown in the lower portion of the screen The actual test data can be shown in either tabular form or graphical form, with the graphical form dependent on the type of data (i.e., Manual Mode, Cooling Curve, or Heating Curve) previously collected.
	This screen is used to verify the correct operation of the systems's forcing and measurement circuitry. First the operator clicks on either the Voltage (for IC Mode) or Current (for Diode Mode) button on the lower left to select which form of Verify is required. Then selects the range to be verified on the middle left. Clicking on the green right arrow icon starts the verification process. Instructions for performing the Verify operation will appear on the top left. After conforming to the instructions, clicking on the OK button starts the actual measurements. When the process is over, the white boxes will be filled in with the measured data results. Data shown in black conforms to the system's accuracy limits. Data values shown in red are higher than acceptable and data values shown in blue indicates below acceptable limits.
	The Calibrate screen is similar to the one above but causes the system to actually perform a calibrations process that generates a look-up table that adjusts programm- ed values to give the correct results. Once the calibration is completed, the data is shown in black (okay), red (value high) and blue (value low). The Calibrate process only needs to be performed if the Verify data shows red or blue data values.

The Thermal Test System software was developed for TEA by Consultronix International.

If you would like more information on any of these or other Thermal Test System screens, please contact us by e-mail using the address shown above. You can also use the TEA message response form. Click here to return toTEA main page.