Semiconductor Thermal Analyzer
 
 
 
 
 
 

Component Thermal Resistance Measurements

Analysis Tech manufactures electronic test systems for measuring the thermal characteristics of semiconductor devices. These automated test systems utilize the intrinsic electrical characteristics of semiconductors to determine the internal junction temperature of functional devices. This technique is commonly termed the electrical method of junction temperature measurement. Using the measured junction temperature, package thermal resistances and transient thermal impedances can be determined. Junction-to-ambient and junction-to-case thermal resistances are common objectives.

Our Thermal Analyzers are capable of die-attachment evaluation as well as complete transient thermal characterization based on rapid, nondestructive thermal power pulse tests. All Analysis Tech Thermal Analyzers are capable of testing all device types for both thermal resistance and transient tests. All test methods used satisfy the appropriate MIL and JEDEC standards. Analysis Tech also offers a complete line of thermal test fixtures and thermal test PWBs. 

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